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AI model extracts hidden semiconductor properties from simple transistor tests in under 1 millisecond

A tandem neural network capable of inferring key physical parameters of semiconductor materials from simple transistor measurements has been developed, as reported by researchers from the Institute of ...
Nature

Combining quasi-one-dimensional modeling with region-wise structure analysis for rapid technology computer-aided design simulations of gate-all-around MOSFETs

The research and development process of semiconductor device technology heavily relies on technology computer-aided design simulations. However, long simulation times remain a significant challenge ...
Semiconductor Engineering

Accelerating Semiconductor Innovation Through Machine Learning-Driven Modeling

The semiconductor industry is entering an era of unprecedented complexity, driven by advanced architectures such as Gate-All-Around (GAA) transistors, wide-bandgap materials like GaN and SiC, and ...
Semiconductor Engineering

Wide Bandgap Semiconductors: What Modeling Challenges Must We Overcome

As power electronics shrink in size, the demands on power, frequency, and efficiency grow exponentially. The semiconductor industry is leaning heavily into wide bandgap materials like gallium nitride ...
Nature

Interpreting artificial neural network-based modeling of 4 H-SiC mosfets using explainable AI

Wide bandgap (WBG) semiconductors such as 4 H-SiC MOSFETs are key enablers for next-generation power electronics due to their superior efficiency and high-temperature capability. However, their ...
Morningstar

Atomera Extends Collaboration With Synopsys to Accelerate GaN Modeling in High-Value RF and Power Devices

Atomera’s quantum-engineered MST® films and Synopsys’ TCAD simulation combine to accelerate next-generation GaN device development for RF and power electronics Atomera Incorporated (NASDAQ: ATOM), a ...
AZoNano

Semiconductor Failure Analysis Techniques

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...